The former is used for evaluating precisely figured very smooth surfaces while the latter is used for topography of rough surfaces. An integrated high-resolution closed-loop translation stage is used to scan the mirror's surface in both x and y directions to automatically acquire measurement maps at predetermined surface sites for roughness evaluation and for subaperture microstitching. While optical metrology tools are adequate for day-to-day measurements and for rapid turnaround measurements to support the fabrication of K-B mirrors by profile coating, the true validation of an x-ray optics is best done at the working x-ray wavelength.
To this end, an x-ray Talbot grating interferometer system is currently being implemented as standard for optics evaluation at 1-BM Optics and Detectors Testing beamline using operations funds. Is having a nominal mold, built according to the computer-aided design CAD file, not a prerequisite for obtaining a nominal final part?
Unfortunately, no. Multiple unpredictable phenomena, such as shrinkage, come into play when producing castings. Because metal fusion is a complex phenomenon, the manufacturing process does not follow a linear and repeatable path from the mold to the final part.
Clients ask for perfect parts — according to specifications and within tolerances — not for perfect molds. Therefore, it is always preferable to first inspect the parts not the molds and, then, to make changes backward on the die if specifications are not met. Controlling the quality of all of the stations of the manufacturing process is an ambitious project.
Many unforeseeable phenomena that are difficult to control make it impossible to predict the final result before getting the parts in hand. Shipping non-compliant parts to clients in large quantities can result in financial and legal issues. To protect themselves, clients demand quality inspection reports on each part. This is where optical metrology can be of great help to the metalworking industry. With optical metrology, the metalworking industry gets a portable, easy-to-use, quick, and efficient instrument for measuring, inspecting, and validating castings before and after machining.
Portable because the measuring tool can be taken directly to the casting on the shop floor in the production environment. Because of these characteristics, which are specific to portable 3D scanners, castings no longer have to be brought to the coordinate measuring machine CMM.
Precious time is saved, allowing for more inspections. Easy to use because portable 3D scanners offer a digital Go — No Go feature, which enables operators to quickly evaluate dimensional measurements and easily identify parts that do not meet the required tolerances.
Camera lenses used in smart phones are made up of aspheric elements. The manufacturing yield for a smart phone lens assembly depends not only on the shape of these complicated aspheres, but on the various built-in features that allow individual lenses to fall into alignment when assembled in a lens barrel. As cameras increase in image quality, tolerances of lens designs become tighter, and at the same time characterization requirements become broader.
Increasingly complex camera designs require complex surface geometries. With approximately 40 million micro lenses manufactured every day, there is critical demand for fast, high-quality, reliable metrology to support this scale of precision manufacturing. Lens manufacturers require as much information as possible about the surfaces and the interlocking alignment features quickly and with high confidence.
Through full-surface 3D metrology, the COMPASS system characterizes these complex surfaces without compromising precision or accuracy, and can identify defects such as deviation from design and process asymmetries or manufacturing errors that would otherwise be missed, and which would be detrimental to lens performance and image quality.
Identifying and quantifying defects can give manufacturers valuable insight about their processes. Flexible Circuits. Many of the internal components of a modern smart phone are connected using flexible circuits in order to save space, weight, and energy consumption. These circuits pack a large quantity of connections into a small area, and minor flaws in a relatively small, inexpensive component can result in a completely unusable high-value device. It is important to evaluate the critical lateral dimensions and topography of the components usually electrical traces used in such flexible circuits.
Historically this would have been done using two separate metrology systems, but ZYGO optical profilers are able to combine both lateral and vertical metrology tasks into a single, automated solution. Close Privacy Overview This website uses cookies to improve your experience while you navigate through the website. Out of these cookies, the cookies that are categorized as necessary are stored on your browser as they are essential for the working of basic functionalities of the website. We also use third-party cookies that help us analyze and understand how you use this website.
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